Daily Papers

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive demands of these industries, which encompass high performance, consistency, and fast operation, along with the capacity to leverage the entirety of the available training data. Addressing these gaps, we introduce SuperSimpleNet, an innovative discriminative model that evolved from SimpleNet. This advanced model significantly enhances its predecessor's training consistency, inference time, as well as detection performance. SuperSimpleNet operates in an unsupervised manner using only normal training images but also benefits from labelled abnormal training images when they are available. SuperSimpleNet achieves state-of-the-art results in both the supervised and the unsupervised settings, as demonstrated by experiments across four challenging benchmark datasets. Code: https://github.com/blaz-r/SuperSimpleNet .

Visual surface anomaly detection aims to detect local image regions that significantly deviate from normal appearance. Recent surface anomaly detection methods rely on generative models to accurately reconstruct the normal areas and to fail on anomalies. These methods are trained only on anomaly-free images, and often require hand-crafted post-processing steps to localize the anomalies, which prohibits optimizing the feature extraction for maximal detection capability. In addition to reconstructive approach, we cast surface anomaly detection primarily as a discriminative problem and propose a discriminatively trained reconstruction anomaly embedding model (DRAEM). The proposed method learns a joint representation of an anomalous image and its anomaly-free reconstruction, while simultaneously learning a decision boundary between normal and anomalous examples. The method enables direct anomaly localization without the need for additional complicated post-processing of the network output and can be trained using simple and general anomaly simulations. On the challenging MVTec anomaly detection dataset, DRAEM outperforms the current state-of-the-art unsupervised methods by a large margin and even delivers detection performance close to the fully-supervised methods on the widely used DAGM surface-defect detection dataset, while substantially outperforming them in localization accuracy.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the effectiveness of ML in wafer defect identification, there is a noticeable absence of comprehensive reviews on this subject. This survey attempts to fill this void by amalgamating available literature and providing an in-depth analysis of the advantages, limitations, and potential applications of various ML classification algorithms in the realm of wafer defect detection. An innovative taxonomy of methodologies that we present provides a detailed classification of algorithms into more refined categories and techniques. This taxonomy follows a three-tier structure, starting from broad methodology categories and ending with specific techniques. It aids researchers in comprehending the complex relationships between different algorithms and their techniques. We employ a rigorous empirical and experimental evaluation to rank these varying techniques. For the empirical evaluation, we assess techniques based on a set of five criteria. The experimental evaluation ranks the algorithms employing the same techniques, sub-categories, and categories. Also the paper illuminates the future prospects of ML classification techniques for wafer defect identification, underscoring potential advancements and opportunities for further research in this field

Industrial anomaly detection is generally addressed as an unsupervised task that aims at locating defects with only normal training samples. Recently, numerous 2D anomaly detection methods have been proposed and have achieved promising results, however, using only the 2D RGB data as input is not sufficient to identify imperceptible geometric surface anomalies. Hence, in this work, we focus on multi-modal anomaly detection. Specifically, we investigate early multi-modal approaches that attempted to utilize models pre-trained on large-scale visual datasets, i.e., ImageNet, to construct feature databases. And we empirically find that directly using these pre-trained models is not optimal, it can either fail to detect subtle defects or mistake abnormal features as normal ones. This may be attributed to the domain gap between target industrial data and source data.Towards this problem, we propose a Local-to-global Self-supervised Feature Adaptation (LSFA) method to finetune the adaptors and learn task-oriented representation toward anomaly detection.Both intra-modal adaptation and cross-modal alignment are optimized from a local-to-global perspective in LSFA to ensure the representation quality and consistency in the inference stage.Extensive experiments demonstrate that our method not only brings a significant performance boost to feature embedding based approaches, but also outperforms previous State-of-The-Art (SoTA) methods prominently on both MVTec-3D AD and Eyecandies datasets, e.g., LSFA achieves 97.1% I-AUROC on MVTec-3D, surpass previous SoTA by +3.4%.

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a diverse collection of 14 industrial inspection datasets, uniquely poised to meet these challenges. Unlike previous datasets, VISION brings versatility to defect detection, offering annotation masks across all splits and catering to various detection methodologies. Our datasets also feature instance-segmentation annotation, enabling precise defect identification. With a total of 18k images encompassing 44 defect types, VISION strives to mirror a wide range of real-world production scenarios. By supporting two ongoing challenge competitions on the VISION Datasets, we hope to foster further advancements in vision-based industrial inspection.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

Unsupervised anomaly in industry has been a concerning topic and a stepping stone for high performance industrial automation process. The vast majority of industry-oriented methods focus on learning from good samples to detect anomaly notwithstanding some specific industrial scenario requiring even less specific training and therefore a generalization for anomaly detection. The obvious use case is the fabric anomaly detection, where we have to deal with a really wide range of colors and types of textile and a stoppage of the production line for training could not be considered. In this paper, we propose an automation process for industrial fabric texture defect detection with a specificity-learning process during the domain-generalized anomaly detection. Combining the ability to generalize and the learning process offer a fast and precise anomaly detection and segmentation. The main contributions of this paper are the following: A domain-generalization texture anomaly detection method achieving the state-of-the-art performances, a fast specific training on good samples extracted by the proposed method, a self-evaluation method based on custom defect creation and an automatic detection of already seen fabric to prevent re-training.

Printed Circuit Boards are the foundation for the functioning of any electronic device, and therefore are an essential component for various industries such as automobile, communication, computation, etc. However, one of the challenges faced by the PCB manufacturers in the process of manufacturing of the PCBs is the faulty placement of its components including missing components. In the present scenario the infrastructure required to ensure adequate quality of the PCB requires a lot of time and effort. The authors present a novel solution for detecting missing components and classifying them in a resourceful manner. The presented algorithm focuses on pixel theory and object detection, which has been used in combination to optimize the results from the given dataset.

In recent years, Printed Circuit Boards (PCB) have become the backbone of a large number of consumer electronic devices leading to a surge in their production. This has made it imperative to employ automatic inspection systems to identify manufacturing defects in PCB before they are installed in the respective systems. An important task in this regard is the classification of defects as either true or pseudo defects, which decides if the PCB is to be re-manufactured or not. This work proposes a novel approach to detect most common defects in the PCBs. The problem has been approached by employing highly discriminative features based on multi-scale wavelet transform, which are further boosted by using a kernalized version of the support vector machines (SVM). A real world printed circuit board dataset has been used for quantitative analysis. Experimental results demonstrated the efficacy of the proposed method.

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the introduction and comparison of new methods. In this paper, we published a synthesized PCB dataset containing 1386 images with 6 kinds of defects for the use of detection, classification and registration tasks. Besides, we proposed a reference based method to inspect and trained an end-to-end convolutional neural network to classify the defects. Unlike conventional approaches that require pixel-by-pixel processing, our method firstly locate the defects and then classify them by neural networks, which shows superior performance on our dataset.

Unsupervised texture anomaly detection has been a concerning topic in a vast amount of industrial processes. Patterned textures inspection, particularly in the context of fabric defect detection, is indeed a widely encountered use case. This task involves handling a diverse spectrum of colors and textile types, encompassing a wide range of fabrics. Given the extensive variability in colors, textures, and defect types, fabric defect detection poses a complex and challenging problem in the field of patterned textures inspection. In this article, we propose a knowledge distillation-based approach tailored specifically for addressing the challenge of unsupervised anomaly detection in textures resembling fabrics. Our method aims to redefine the recently introduced reverse distillation approach, which advocates for an encoder-decoder design to mitigate classifier bias and to prevent the student from reconstructing anomalies. In this study, we present a new reverse distillation technique for the specific task of fabric defect detection. Our approach involves a meticulous design selection that strategically highlights high-level features. To demonstrate the capabilities of our approach both in terms of performance and inference speed, we conducted a series of experiments on multiple texture datasets, including MVTEC AD, AITEX, and TILDA, alongside conducting experiments on a dataset acquired from a textile manufacturing facility. The main contributions of this paper are the following: a robust texture anomaly detector utilizing a reverse knowledge-distillation technique suitable for both anomaly detection and domain generalization and a novel dataset encompassing a diverse range of fabrics and defects.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

This expository paper introduces a simplified approach to image-based quality inspection in manufacturing using OpenAI's CLIP (Contrastive Language-Image Pretraining) model adapted for few-shot learning. While CLIP has demonstrated impressive capabilities in general computer vision tasks, its direct application to manufacturing inspection presents challenges due to the domain gap between its training data and industrial applications. We evaluate CLIP's effectiveness through five case studies: metallic pan surface inspection, 3D printing extrusion profile analysis, stochastic textured surface evaluation, automotive assembly inspection, and microstructure image classification. Our results show that CLIP can achieve high classification accuracy with relatively small learning sets (50-100 examples per class) for single-component and texture-based applications. However, the performance degrades with complex multi-component scenes. We provide a practical implementation framework that enables quality engineers to quickly assess CLIP's suitability for their specific applications before pursuing more complex solutions. This work establishes CLIP-based few-shot learning as an effective baseline approach that balances implementation simplicity with robust performance, demonstrated in several manufacturing quality control applications.

The capability to detect boulders on the surface of small bodies is beneficial for vision-based applications such as hazard detection during critical operations and navigation. This task is challenging due to the wide assortment of irregular shapes, the characteristics of the boulders population, and the rapid variability in the illumination conditions. Moreover, the lack of publicly available labeled datasets for these applications damps the research about data-driven algorithms. In this work, the authors provide a statistical characterization and setup used for the generation of two datasets about boulders on small bodies that are made publicly available.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

In this paper, we introduce an approach for detecting modifications in assembled printed circuit boards based on photographs taken without tight control over perspective and illumination conditions. One instance of this problem is the visual inspection of gas pumps PCBs, which can be modified by fraudsters wishing to deceive costumers or evade taxes. Given the uncontrolled environment and the huge number of possible modifications, we address the problem as a case of anomaly detection, proposing an approach that is directed towards the characteristics of that scenario, while being well-suited for other similar applications. The proposed approach employs a deep convolutional autoencoder trained to reconstruct images of an unmodified board, but which remains unable to do the same for images showing modifications. By comparing the input image with its reconstruction, it is possible to segment anomalies and modifications in a pixel-wise manner. Experiments performed on a dataset built to represent real-world situations (and which we will make publicly available) show that our approach outperforms other state-of-the-art approaches for anomaly segmentation in the considered scenario, while producing comparable results on the popular MVTec-AD dataset for a more general object anomaly detection task.

One persistent obstacle in industrial quality inspection is the detection of anomalies. In real-world use cases, two problems must be addressed: anomalous data is sparse and the same types of anomalies need to be detected on previously unseen objects. Current anomaly detection approaches can be trained with sparse nominal data, whereas domain generalization approaches enable detecting objects in previously unseen domains. Utilizing those two observations, we introduce the hybrid task of domain generalization on sparse classes. To introduce an accompanying dataset for this task, we present a modification of the well-established MVTec AD dataset by generating three new datasets. In addition to applying existing methods for benchmark, we design two embedding-based approaches, Spatial Embedding MLP (SEMLP) and Labeled PatchCore. Overall, SEMLP achieves the best performance with an average image-level AUROC of 87.2 % vs. 80.4 % by MIRO. The new and openly available datasets allow for further research to improve industrial anomaly detection.

Automated detection of defects in Printed Circuit Board (PCB) manufacturing using Solder Paste Inspection (SPI) and Automated Optical Inspection (AOI) machines can help improve operational efficiency and significantly reduce the need for manual intervention. In this paper, using SPI-extracted features of 6 million pins, we demonstrate a data-centric approach to train Machine Learning (ML) models to detect PCB defects at three stages of PCB manufacturing. The 6 million PCB pins correspond to 2 million components that belong to 15,387 PCBs. Using a base extreme gradient boosting (XGBoost) ML model, we iterate on the data pre-processing step to improve detection performance. Combining pin-level SPI features using component and PCB IDs, we developed training instances also at the component and PCB level. This allows the ML model to capture any inter-pin, inter-component, or spatial effects that may not be apparent at the pin level. Models are trained at the pin, component, and PCB levels, and the detection results from the different models are combined to identify defective components.

In recent years, the deterioration of artificial materials used in structures has become a serious social issue, increasing the importance of inspections. Non-destructive testing is gaining increased demand due to its capability to inspect for defects and deterioration in structures while preserving their functionality. Among these, Laser Ultrasonic Visualization Testing (LUVT) stands out because it allows the visualization of ultrasonic propagation. This makes it visually straightforward to detect defects, thereby enhancing inspection efficiency. With the increasing number of the deterioration structures, challenges such as a shortage of inspectors and increased workload in non-destructive testing have become more apparent. Efforts to address these challenges include exploring automated inspection using machine learning. However, the lack of anomalous data with defects poses a barrier to improving the accuracy of automated inspection through machine learning. Therefore, in this study, we propose a method for automated LUVT inspection using an anomaly detection approach with a diffusion model that can be trained solely on negative examples (defect-free data). We experimentally confirmed that our proposed method improves defect detection and localization compared to general object detection algorithms used previously.

3D anomaly detection plays a crucial role in monitoring parts for localized inherent defects in precision manufacturing. Embedding-based and reconstruction-based approaches are among the most popular and successful methods. However, there are two major challenges to the practical application of the current approaches: 1) the embedded models suffer the prohibitive computational and storage due to the memory bank structure; 2) the reconstructive models based on the MAE mechanism fail to detect anomalies in the unmasked regions. In this paper, we propose R3D-AD, reconstructing anomalous point clouds by diffusion model for precise 3D anomaly detection. Our approach capitalizes on the data distribution conversion of the diffusion process to entirely obscure the input's anomalous geometry. It step-wisely learns a strict point-level displacement behavior, which methodically corrects the aberrant points. To increase the generalization of the model, we further present a novel 3D anomaly simulation strategy named Patch-Gen to generate realistic and diverse defect shapes, which narrows the domain gap between training and testing. Our R3D-AD ensures a uniform spatial transformation, which allows straightforwardly generating anomaly results by distance comparison. Extensive experiments show that our R3D-AD outperforms previous state-of-the-art methods, achieving 73.4% Image-level AUROC on the Real3D-AD dataset and 74.9% Image-level AUROC on the Anomaly-ShapeNet dataset with an exceptional efficiency.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

Despite the growing demand for accurate surface normal estimation models, existing methods use general-purpose dense prediction models, adopting the same inductive biases as other tasks. In this paper, we discuss the inductive biases needed for surface normal estimation and propose to (1) utilize the per-pixel ray direction and (2) encode the relationship between neighboring surface normals by learning their relative rotation. The proposed method can generate crisp - yet, piecewise smooth - predictions for challenging in-the-wild images of arbitrary resolution and aspect ratio. Compared to a recent ViT-based state-of-the-art model, our method shows a stronger generalization ability, despite being trained on an orders of magnitude smaller dataset. The code is available at https://github.com/baegwangbin/DSINE.

The most widely used method for obtaining high-quality two-dimensional materials is through mechanical exfoliation of bulk crystals. Manual identification of suitable flakes from the resulting random distribution of crystal thicknesses and sizes on a substrate is a time-consuming, tedious task. Here, we present a platform for fully automated scanning, detection, and classification of two-dimensional materials, the source code of which we make openly available. Our platform is designed to be accurate, reliable, fast, and versatile in integrating new materials, making it suitable for everyday laboratory work. The implementation allows fully automated scanning and analysis of wafers with an average inference time of 100 ms for images of 2.3 Mpixels. The developed detection algorithm is based on a combination of the flakes' optical contrast toward the substrate and their geometric shape. We demonstrate that it is able to detect the majority of exfoliated flakes of various materials, with an average recall (AR50) between 67% and 89%. We also show that the algorithm can be trained with as few as five flakes of a given material, which we demonstrate for the examples of few-layer graphene, WSe_2, MoSe_2, CrI_3, 1T-TaS_2 and hexagonal BN. Our platform has been tested over a two-year period, during which more than 10^6 images of multiple different materials were acquired by over 30 individual researchers.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

Printed Circuit Board (PCB) assurance in the optical domain is a crucial field of study. Though there are many existing PCB assurance methods using image processing, computer vision (CV), and machine learning (ML), the PCB field is complex and increasingly evolving so new techniques are required to overcome the emerging problems. Existing ML-based methods outperform traditional CV methods, however they often require more data, have low explainability, and can be difficult to adapt when a new technology arises. To overcome these challenges, CV methods can be used in tandem with ML methods. In particular, human-interpretable CV algorithms such as those that extract color, shape, and texture features increase PCB assurance explainability. This allows for incorporation of prior knowledge, which effectively reduce the number of trainable ML parameters and thus, the amount of data needed to achieve high accuracy when training or retraining an ML model. Hence, this study explores the benefits and limitations of a variety of common computer vision-based features for the task of PCB component detection using semantic data. Results of this study indicate that color features demonstrate promising performance for PCB component detection. The purpose of this paper is to facilitate collaboration between the hardware assurance, computer vision, and machine learning communities.

Despite significant advances in image anomaly detection and segmentation, few methods use 3D information. We utilize a recently introduced 3D anomaly detection dataset to evaluate whether or not using 3D information is a lost opportunity. First, we present a surprising finding: standard color-only methods outperform all current methods that are explicitly designed to exploit 3D information. This is counter-intuitive as even a simple inspection of the dataset shows that color-only methods are insufficient for images containing geometric anomalies. This motivates the question: how can anomaly detection methods effectively use 3D information? We investigate a range of shape representations including hand-crafted and deep-learning-based; we demonstrate that rotation invariance plays the leading role in the performance. We uncover a simple 3D-only method that beats all recent approaches while not using deep learning, external pre-training datasets, or color information. As the 3D-only method cannot detect color and texture anomalies, we combine it with color-based features, significantly outperforming previous state-of-the-art. Our method, dubbed BTF (Back to the Feature) achieves pixel-wise ROCAUC: 99.3% and PRO: 96.4% on MVTec 3D-AD.

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

3D anomaly detection and localization is of great significance for industrial inspection. Prior 3D anomaly detection and localization methods focus on the setting that the testing data share the same category as the training data which is normal. However, in real-world applications, the normal training data for the target 3D objects can be unavailable due to issues like data privacy or export control regulation. To tackle these challenges, we identify a new task -- zero-shot 3D anomaly detection and localization, where the training and testing classes do not overlap. To this end, we design 3DzAL, a novel patch-level contrastive learning framework based on pseudo anomalies generated using the inductive bias from task-irrelevant 3D xyz data to learn more representative feature representations. Furthermore, we train a normalcy classifier network to classify the normal patches and pseudo anomalies and utilize the classification result jointly with feature distance to design anomaly scores. Instead of directly using the patch point clouds, we introduce adversarial perturbations to the input patch xyz data before feeding into the 3D normalcy classifier for the classification-based anomaly score. We show that 3DzAL outperforms the state-of-the-art anomaly detection and localization performance.

In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rendering in computer graphics, a new image segmentation method that can generate high-resolution segmentation masks. It can also be flexibly integrated into common instance segmentation meta-architecture such as Mask-RCNN and semantic meta-architecture such as FCN. We implemented a model, termed as SEMI-PointRend, to generate precise segmentation masks by applying the PointRend neural network module. In this paper, we focus on comparing the defect segmentation predictions of SEMI-PointRend and Mask-RCNN for various defect types (line-collapse, single bridge, thin bridge, multi bridge non-horizontal). We show that SEMI-PointRend can outperforms Mask R-CNN by up to 18.8% in terms of segmentation mean average precision.

The science of fractography revolves around the correlation between topographic characteristics of the fracture surface and the mechanisms and external conditions leading to their creation. While being a topic of investigation for centuries, it has remained mostly qualitative to date. A quantitative analysis of fracture surfaces is of prime interest for both the scientific community and the industrial sector, bearing the potential for improved understanding on the mechanisms controlling the fracture process and at the same time assessing the reliability of computational models currently being used for material design. With new advances in the field of image analysis, and specifically with machine learning tools becoming more accessible and reliable, it is now feasible to automate the process of extracting meaningful information from fracture surface images. Here, we propose a method of identifying and quantifying the relative appearance of intergranular and transgranular fracture events from scanning electron microscope images. The newly proposed method is based on a convolutional neural network algorithm for semantic segmentation. The proposed method is extensively tested and evaluated against two ceramic material systems (Al_2O_3,MgAl_2O_4) and shows high prediction accuracy, despite being trained on only one material system (MgAl_2O_4). While here attention is focused on brittle fracture characteristics, the method can be easily extended to account for other fracture morphologies, such as dimples, fatigue striations, etc.

In this work we explore the application of AI to robotic welding. Robotic welding is a widely used technology in many industries, but robots currently do not have the capability to detect welding defects which get introduced due to various reasons in the welding process. We describe how deep-learning methods can be applied to detect weld defects in real-time by recording the welding process with microphones and a camera. Our findings are based on a large database with more than 4000 welding samples we collected which covers different weld types, materials and various defect categories. All deep learning models are trained in an unsupervised fashion because the space of possible defects is large and the defects in our data may contain biases. We demonstrate that a reliable real-time detection of most categories of weld defects is feasible both from audio and video, with improvements achieved by combining both modalities. Specifically, the multi-modal approach achieves an average Area-under-ROC-Curve (AUC) of 0.92 over all eleven defect types in our data. We conclude the paper with an analysis of the results by defect type and a discussion of future work.

In this paper, we introduce a new benchmark for continual learning in anomaly detection, aimed at better reflecting real-world deployment scenarios. Our benchmark, Continual-MEGA, includes a large and diverse dataset that significantly expands existing evaluation settings by combining carefully curated existing datasets with our newly proposed dataset, ContinualAD. In addition to standard continual learning with expanded quantity, we propose a novel scenario that measures zero-shot generalization to unseen classes, those not observed during continual adaptation. This setting poses a new problem setting that continual adaptation also enhances zero-shot performance. We also present a unified baseline algorithm that improves robustness in few-shot detection and maintains strong generalization. Through extensive evaluations, we report three key findings: (1) existing methods show substantial room for improvement, particularly in pixel-level defect localization; (2) our proposed method consistently outperforms prior approaches; and (3) the newly introduced ContinualAD dataset enhances the performance of strong anomaly detection models. We release the benchmark and code in https://github.com/Continual-Mega/Continual-Mega.

The increasing complexity of industrial anomaly detection (IAD) has positioned multimodal detection methods as a focal area of machine vision research. However, dedicated multimodal datasets specifically tailored for IAD remain limited. Pioneering datasets like MVTec 3D have laid essential groundwork in multimodal IAD by incorporating RGB+3D data, but still face challenges in bridging the gap with real industrial environments due to limitations in scale and resolution. To address these challenges, we introduce Real-IAD D3, a high-precision multimodal dataset that uniquely incorporates an additional pseudo3D modality generated through photometric stereo, alongside high-resolution RGB images and micrometer-level 3D point clouds. Real-IAD D3 features finer defects, diverse anomalies, and greater scale across 20 categories, providing a challenging benchmark for multimodal IAD Additionally, we introduce an effective approach that integrates RGB, point cloud, and pseudo-3D depth information to leverage the complementary strengths of each modality, enhancing detection performance. Our experiments highlight the importance of these modalities in boosting detection robustness and overall IAD performance. The dataset and code are publicly accessible for research purposes at https://realiad4ad.github.io/Real-IAD D3

Visual anomaly classification and segmentation are vital for automating industrial quality inspection. The focus of prior research in the field has been on training custom models for each quality inspection task, which requires task-specific images and annotation. In this paper we move away from this regime, addressing zero-shot and few-normal-shot anomaly classification and segmentation. Recently CLIP, a vision-language model, has shown revolutionary generality with competitive zero-/few-shot performance in comparison to full-supervision. But CLIP falls short on anomaly classification and segmentation tasks. Hence, we propose window-based CLIP (WinCLIP) with (1) a compositional ensemble on state words and prompt templates and (2) efficient extraction and aggregation of window/patch/image-level features aligned with text. We also propose its few-normal-shot extension WinCLIP+, which uses complementary information from normal images. In MVTec-AD (and VisA), without further tuning, WinCLIP achieves 91.8%/85.1% (78.1%/79.6%) AUROC in zero-shot anomaly classification and segmentation while WinCLIP+ does 93.1%/95.2% (83.8%/96.4%) in 1-normal-shot, surpassing state-of-the-art by large margins.

Automatic detecting anomalous regions in images of objects or textures without priors of the anomalies is challenging, especially when the anomalies appear in very small areas of the images, making difficult-to-detect visual variations, such as defects on manufacturing products. This paper proposes an effective unsupervised anomaly segmentation approach that can detect and segment out the anomalies in small and confined regions of images. Concretely, we develop a multi-scale regional feature generator that can generate multiple spatial context-aware representations from pre-trained deep convolutional networks for every subregion of an image. The regional representations not only describe the local characteristics of corresponding regions but also encode their multiple spatial context information, making them discriminative and very beneficial for anomaly detection. Leveraging these descriptive regional features, we then design a deep yet efficient convolutional autoencoder and detect anomalous regions within images via fast feature reconstruction. Our method is simple yet effective and efficient. It advances the state-of-the-art performances on several benchmark datasets and shows great potential for real applications.

Computer-aided design (CAD) is crucial in prototyping 3D objects through geometric instructions (i.e., CAD programs). In practical design workflows, designers often engage in time-consuming reviews and refinements of these prototypes by comparing them with reference images. To bridge this gap, we introduce the CAD review task to automatically detect and correct potential errors, ensuring consistency between the constructed 3D objects and reference images. However, recent advanced multimodal large language models (MLLMs) struggle to recognize multiple geometric components and perform spatial geometric operations within the CAD program, leading to inaccurate reviews. In this paper, we propose the CAD program repairer (ReCAD) framework to effectively detect program errors and provide helpful feedback on error correction. Additionally, we create a dataset, CADReview, consisting of over 20K program-image pairs, with diverse errors for the CAD review task. Extensive experiments demonstrate that our ReCAD significantly outperforms existing MLLMs, which shows great potential in design applications.

Neural implicit surface learning has shown significant progress in multi-view 3D reconstruction, where an object is represented by multilayer perceptrons that provide continuous implicit surface representation and view-dependent radiance. However, current methods often fail to accurately reconstruct reflective surfaces, leading to severe ambiguity. To overcome this issue, we propose Ref-NeuS, which aims to reduce ambiguity by attenuating the effect of reflective surfaces. Specifically, we utilize an anomaly detector to estimate an explicit reflection score with the guidance of multi-view context to localize reflective surfaces. Afterward, we design a reflection-aware photometric loss that adaptively reduces ambiguity by modeling rendered color as a Gaussian distribution, with the reflection score representing the variance. We show that together with a reflection direction-dependent radiance, our model achieves high-quality surface reconstruction on reflective surfaces and outperforms the state-of-the-arts by a large margin. Besides, our model is also comparable on general surfaces.

Visual anomaly detection, an important problem in computer vision, is usually formulated as a one-class classification and segmentation task. The student-teacher (S-T) framework has proved to be effective in solving this challenge. However, previous works based on S-T only empirically applied constraints on normal data and fused multi-level information. In this study, we propose an improved model called DeSTSeg, which integrates a pre-trained teacher network, a denoising student encoder-decoder, and a segmentation network into one framework. First, to strengthen the constraints on anomalous data, we introduce a denoising procedure that allows the student network to learn more robust representations. From synthetically corrupted normal images, we train the student network to match the teacher network feature of the same images without corruption. Second, to fuse the multi-level S-T features adaptively, we train a segmentation network with rich supervision from synthetic anomaly masks, achieving a substantial performance improvement. Experiments on the industrial inspection benchmark dataset demonstrate that our method achieves state-of-the-art performance, 98.6% on image-level AUC, 75.8% on pixel-level average precision, and 76.4% on instance-level average precision.

We propose a learning-based method to recover normals, specularity, and roughness from a single diffuse image of a material, using microgeometry appearance as our primary cue. Previous methods that work on single images tend to produce over-smooth outputs with artifacts, operate at limited resolution, or train one model per class with little room for generalization. Previous methods that work on single images tend to produce over-smooth outputs with artifacts, operate at limited resolution, or train one model per class with little room for generalization. In contrast, in this work, we propose a novel capture approach that leverages a generative network with attention and a U-Net discriminator, which shows outstanding performance integrating global information at reduced computational complexity. We showcase the performance of our method with a real dataset of digitized textile materials and show that a commodity flatbed scanner can produce the type of diffuse illumination required as input to our method. Additionally, because the problem might be illposed -more than a single diffuse image might be needed to disambiguate the specular reflection- or because the training dataset is not representative enough of the real distribution, we propose a novel framework to quantify the model's confidence about its prediction at test time. Our method is the first one to deal with the problem of modeling uncertainty in material digitization, increasing the trustworthiness of the process and enabling more intelligent strategies for dataset creation, as we demonstrate with an active learning experiment.

This paper proposes a shape anchor guided learning strategy (AncLearn) for robust holistic indoor scene understanding. We observe that the search space constructed by current methods for proposal feature grouping and instance point sampling often introduces massive noise to instance detection and mesh reconstruction. Accordingly, we develop AncLearn to generate anchors that dynamically fit instance surfaces to (i) unmix noise and target-related features for offering reliable proposals at the detection stage, and (ii) reduce outliers in object point sampling for directly providing well-structured geometry priors without segmentation during reconstruction. We embed AncLearn into a reconstruction-from-detection learning system (AncRec) to generate high-quality semantic scene models in a purely instance-oriented manner. Experiments conducted on the challenging ScanNetv2 dataset demonstrate that our shape anchor-based method consistently achieves state-of-the-art performance in terms of 3D object detection, layout estimation, and shape reconstruction. The code will be available at https://github.com/Geo-Tell/AncRec.

There can be numerous electronic components on a given PCB, making the task of visual inspection to detect defects very time-consuming and prone to error, especially at scale. There has thus been significant interest in automatic PCB component detection, particularly leveraging deep learning. However, deep neural networks typically require high computational resources, possibly limiting their feasibility in real-world use cases in manufacturing, which often involve high-volume and high-throughput detection with constrained edge computing resource availability. As a result of an exploration of efficient deep neural network architectures for this use case, we introduce PCBDet, an attention condenser network design that provides state-of-the-art inference throughput while achieving superior PCB component detection performance compared to other state-of-the-art efficient architecture designs. Experimental results show that PCBDet can achieve up to 2times inference speed-up on an ARM Cortex A72 processor when compared to an EfficientNet-based design while achieving sim2-4\% higher mAP on the FICS-PCB benchmark dataset.

3D surface reconstruction from point clouds is a key step in areas such as content creation, archaeology, digital cultural heritage, and engineering. Current approaches either try to optimize a non-data-driven surface representation to fit the points, or learn a data-driven prior over the distribution of commonly occurring surfaces and how they correlate with potentially noisy point clouds. Data-driven methods enable robust handling of noise and typically either focus on a global or a local prior, which trade-off between robustness to noise on the global end and surface detail preservation on the local end. We propose PPSurf as a method that combines a global prior based on point convolutions and a local prior based on processing local point cloud patches. We show that this approach is robust to noise while recovering surface details more accurately than the current state-of-the-art. Our source code, pre-trained model and dataset are available at: https://github.com/cg-tuwien/ppsurf

Inferring the depth of transparent or mirror (ToM) surfaces represents a hard challenge for either sensors, algorithms, or deep networks. We propose a simple pipeline for learning to estimate depth properly for such surfaces with neural networks, without requiring any ground-truth annotation. We unveil how to obtain reliable pseudo labels by in-painting ToM objects in images and processing them with a monocular depth estimation model. These labels can be used to fine-tune existing monocular or stereo networks, to let them learn how to deal with ToM surfaces. Experimental results on the Booster dataset show the dramatic improvements enabled by our remarkably simple proposal.

In this paper, the concept of representation learning based on deep neural networks is applied as an alternative to the use of handcrafted features in a method for automatic visual inspection of corroded thermoelectric metallic pipes. A texture convolutional neural network (TCNN) replaces handcrafted features based on Local Phase Quantization (LPQ) and Haralick descriptors (HD) with the advantage of learning an appropriate textural representation and the decision boundaries into a single optimization process. Experimental results have shown that it is possible to reach the accuracy of 99.20% in the task of identifying different levels of corrosion in the internal surface of thermoelectric pipe walls, while using a compact network that requires much less effort in tuning parameters when compared to the handcrafted approach since the TCNN architecture is compact regarding the number of layers and connections. The observed results open up the possibility of using deep neural networks in real-time applications such as the automatic inspection of thermoelectric metal pipes.

The recent rapid development of deep learning has laid a milestone in industrial Image Anomaly Detection (IAD). In this paper, we provide a comprehensive review of deep learning-based image anomaly detection techniques, from the perspectives of neural network architectures, levels of supervision, loss functions, metrics and datasets. In addition, we extract the new setting from industrial manufacturing and review the current IAD approaches under our proposed our new setting. Moreover, we highlight several opening challenges for image anomaly detection. The merits and downsides of representative network architectures under varying supervision are discussed. Finally, we summarize the research findings and point out future research directions. More resources are available at https://github.com/M-3LAB/awesome-industrial-anomaly-detection.

Industrial anomaly detection (IAD) has garnered significant attention and experienced rapid development. However, the recent development of IAD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real-IAD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Industrial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular IAD methods on the Real-IAD dataset, providing a highly challenging benchmark to promote the development of the IAD field.

Surface reconstruction with preservation of geometric features is a challenging computer vision task. Despite significant progress in implicit shape reconstruction, state-of-the-art mesh extraction methods often produce aliased, perceptually distorted surfaces and lack scalability to high-resolution 3D shapes. We present a data-driven approach for automatic feature detection and remeshing that requires only a coarse, aliased mesh as input and scales to arbitrary resolution reconstructions. We define and learn a collection of surface-based fields to (1) capture sharp geometric features in the shape with an implicit vertexwise model and (2) approximate improvements in normals alignment obtained by applying edge-flips with an edgewise model. To support scaling to arbitrary complexity shapes, we learn our fields using local triangulated patches, fusing estimates on complete surface meshes. Our feature remeshing algorithm integrates the learned fields as sharp feature priors and optimizes vertex placement and mesh connectivity for maximum expected surface improvement. On a challenging collection of high-resolution shape reconstructions in the ABC dataset, our algorithm improves over state-of-the-art by 26% normals F-score and 42% perceptual RMSE_{v}.

Genuine leather, such as the hides of cows, crocodiles, lizards and goats usually contain natural and artificial defects, like holes, fly bites, tick marks, veining, cuts, wrinkles and others. A traditional solution to identify the defects is by manual defect inspection, which involves skilled experts. It is time consuming and may incur a high error rate and results in low productivity. This paper presents a series of automatic image processing processes to perform the classification of leather defects by adopting deep learning approaches. Particularly, the leather images are first partitioned into small patches,then it undergoes a pre-processing technique, namely the Canny edge detection to enhance defect visualization. Next, artificial neural network (ANN) and convolutional neural network (CNN) are employed to extract the rich image features. The best classification result achieved is 80.3 %, evaluated on a data set that consists of 2000 samples. In addition, the performance metrics such as confusion matrix and Receiver Operating Characteristic (ROC) are reported to demonstrate the efficiency of the method proposed.

For a very long time, unsupervised learning for anomaly detection has been at the heart of image processing research and a stepping stone for high performance industrial automation process. With the emergence of CNN, several methods have been proposed such as Autoencoders, GAN, deep feature extraction, etc. In this paper, we propose a new method based on the promising concept of knowledge distillation which consists of training a network (the student) on normal samples while considering the output of a larger pretrained network (the teacher). The main contributions of this paper are twofold: First, a reduced student architecture with optimal layer selection is proposed, then a new Student-Teacher architecture with network bias reduction combining two teachers is proposed in order to jointly enhance the performance of anomaly detection and its localization accuracy. The proposed texture anomaly detector has an outstanding capability to detect defects in any texture and a fast inference time compared to the SOTA methods.

A key step in any scanning-based asset creation workflow is to convert unordered point clouds to a surface. Classical methods (e.g., Poisson reconstruction) start to degrade in the presence of noisy and partial scans. Hence, deep learning based methods have recently been proposed to produce complete surfaces, even from partial scans. However, such data-driven methods struggle to generalize to new shapes with large geometric and topological variations. We present Points2Surf, a novel patch-based learning framework that produces accurate surfaces directly from raw scans without normals. Learning a prior over a combination of detailed local patches and coarse global information improves generalization performance and reconstruction accuracy. Our extensive comparison on both synthetic and real data demonstrates a clear advantage of our method over state-of-the-art alternatives on previously unseen classes (on average, Points2Surf brings down reconstruction error by 30\% over SPR and by 270\%+ over deep learning based SotA methods) at the cost of longer computation times and a slight increase in small-scale topological noise in some cases. Our source code, pre-trained model, and dataset are available on: https://github.com/ErlerPhilipp/points2surf

Over the years many ellipse detection algorithms spring up and are studied broadly, while the critical issue of detecting ellipses accurately and efficiently in real-world images remains a challenge. In this paper, we propose a valuable industry-oriented ellipse detector by arc-support line segments, which simultaneously reaches high detection accuracy and efficiency. To simplify the complicated curves in an image while retaining the general properties including convexity and polarity, the arc-support line segments are extracted, which grounds the successful detection of ellipses. The arc-support groups are formed by iteratively and robustly linking the arc-support line segments that latently belong to a common ellipse. Afterward, two complementary approaches, namely, locally selecting the arc-support group with higher saliency and globally searching all the valid paired groups, are adopted to fit the initial ellipses in a fast way. Then, the ellipse candidate set can be formulated by hierarchical clustering of 5D parameter space of initial ellipses. Finally, the salient ellipse candidates are selected and refined as detections subject to the stringent and effective verification. Extensive experiments on three public datasets are implemented and our method achieves the best F-measure scores compared to the state-of-the-art methods. The source code is available at https://github.com/AlanLuSun/High-quality-ellipse-detection.

Large Vision-Language Models (LVLMs) such as MiniGPT-4 and LLaVA have demonstrated the capability of understanding images and achieved remarkable performance in various visual tasks. Despite their strong abilities in recognizing common objects due to extensive training datasets, they lack specific domain knowledge and have a weaker understanding of localized details within objects, which hinders their effectiveness in the Industrial Anomaly Detection (IAD) task. On the other hand, most existing IAD methods only provide anomaly scores and necessitate the manual setting of thresholds to distinguish between normal and abnormal samples, which restricts their practical implementation. In this paper, we explore the utilization of LVLM to address the IAD problem and propose AnomalyGPT, a novel IAD approach based on LVLM. We generate training data by simulating anomalous images and producing corresponding textual descriptions for each image. We also employ an image decoder to provide fine-grained semantic and design a prompt learner to fine-tune the LVLM using prompt embeddings. Our AnomalyGPT eliminates the need for manual threshold adjustments, thus directly assesses the presence and locations of anomalies. Additionally, AnomalyGPT supports multi-turn dialogues and exhibits impressive few-shot in-context learning capabilities. With only one normal shot, AnomalyGPT achieves the state-of-the-art performance with an accuracy of 86.1%, an image-level AUC of 94.1%, and a pixel-level AUC of 95.3% on the MVTec-AD dataset. Code is available at https://github.com/CASIA-IVA-Lab/AnomalyGPT.

In this paper we present SurfaceNet, an approach for estimating spatially-varying bidirectional reflectance distribution function (SVBRDF) material properties from a single image. We pose the problem as an image translation task and propose a novel patch-based generative adversarial network (GAN) that is able to produce high-quality, high-resolution surface reflectance maps. The employment of the GAN paradigm has a twofold objective: 1) allowing the model to recover finer details than standard translation models; 2) reducing the domain shift between synthetic and real data distributions in an unsupervised way. An extensive evaluation, carried out on a public benchmark of synthetic and real images under different illumination conditions, shows that SurfaceNet largely outperforms existing SVBRDF reconstruction methods, both quantitatively and qualitatively. Furthermore, SurfaceNet exhibits a remarkable ability in generating high-quality maps from real samples without any supervision at training time.

Visual anomaly detection is critical in industrial manufacturing, but traditional methods often rely on extensive normal datasets and custom models, limiting scalability. Recent advancements in large-scale visual-language models have significantly improved zero/few-shot anomaly detection. However, these approaches may not fully utilize hierarchical features, potentially missing nuanced details. We introduce a window self-attention mechanism based on the CLIP model, combined with learnable prompts to process multi-level features within a Soldier-Offier Window self-Attention (SOWA) framework. Our method has been tested on five benchmark datasets, demonstrating superior performance by leading in 18 out of 20 metrics compared to existing state-of-the-art techniques.

Shape abstraction is an important task for simplifying complex geometric structures while retaining essential features. Sweep surfaces, commonly found in human-made objects, aid in this process by effectively capturing and representing object geometry, thereby facilitating abstraction. In this paper, we introduce \papername, a novel approach to shape abstraction through sweep surfaces. We propose an effective parameterization for sweep surfaces, utilizing superellipses for profile representation and B-spline curves for the axis. This compact representation, requiring as few as 14 float numbers, facilitates intuitive and interactive editing while preserving shape details effectively. Additionally, by introducing a differentiable neural sweeper and an encoder-decoder architecture, we demonstrate the ability to predict sweep surface representations without supervision. We show the superiority of our model through several quantitative and qualitative experiments throughout the paper. Our code is available at https://mingrui-zhao.github.io/SweepNet/

Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.

Semiconductor lasers have been rapidly evolving to meet the demands of next-generation optical networks. This imposes much more stringent requirements on the laser reliability, which are dominated by degradation mechanisms (e.g., sudden degradation) limiting the semiconductor laser lifetime. Physics-based approaches are often used to characterize the degradation behavior analytically, yet explicit domain knowledge and accurate mathematical models are required. Building such models can be very challenging due to a lack of a full understanding of the complex physical processes inducing the degradation under various operating conditions. To overcome the aforementioned limitations, we propose a new data-driven approach, extracting useful insights from the operational monitored data to predict the degradation trend without requiring any specific knowledge or using any physical model. The proposed approach is based on an unsupervised technique, a conditional variational autoencoder, and validated using vertical-cavity surface-emitting laser (VCSEL) and tunable edge emitting laser reliability data. The experimental results confirm that our model (i) achieves a good degradation prediction and generalization performance by yielding an F1 score of 95.3%, (ii) outperforms several baseline ML based anomaly detection techniques, and (iii) helps to shorten the aging tests by early predicting the failed devices before the end of the test and thereby saving costs

3D perception, especially point cloud classification, has achieved substantial progress. However, in real-world deployment, point cloud corruptions are inevitable due to the scene complexity, sensor inaccuracy, and processing imprecision. In this work, we aim to rigorously benchmark and analyze point cloud classification under corruptions. To conduct a systematic investigation, we first provide a taxonomy of common 3D corruptions and identify the atomic corruptions. Then, we perform a comprehensive evaluation on a wide range of representative point cloud models to understand their robustness and generalizability. Our benchmark results show that although point cloud classification performance improves over time, the state-of-the-art methods are on the verge of being less robust. Based on the obtained observations, we propose several effective techniques to enhance point cloud classifier robustness. We hope our comprehensive benchmark, in-depth analysis, and proposed techniques could spark future research in robust 3D perception.

Spacecraft deployed in outer space are routinely subjected to various forms of damage due to exposure to hazardous environments. In addition, there are significant risks to the subsequent process of in-space repairs through human extravehicular activity or robotic manipulation, incurring substantial operational costs. Recent developments in image segmentation could enable the development of reliable and cost-effective autonomous inspection systems. While these models often require large amounts of training data to achieve satisfactory results, publicly available annotated spacecraft segmentation data are very scarce. Here, we present a new dataset of nearly 64k annotated spacecraft images that was created using real spacecraft models, superimposed on a mixture of real and synthetic backgrounds generated using NASA's TTALOS pipeline. To mimic camera distortions and noise in real-world image acquisition, we also added different types of noise and distortion to the images. Finally, we finetuned YOLOv8 and YOLOv11 segmentation models to generate performance benchmarks for the dataset under well-defined hardware and inference time constraints to mimic real-world image segmentation challenges for real-time onboard applications in space on NASA's inspector spacecraft. The resulting models, when tested under these constraints, achieved a Dice score of 0.92, Hausdorff distance of 0.69, and an inference time of about 0.5 second. The dataset and models for performance benchmark are available at https://github.com/RiceD2KLab/SWiM.

6D object pose estimation suffers from reduced accuracy when applied to metallic objects. We set out to improve the state-of-the-art by addressing challenges such as reflections and specular highlights in industrial applications. Our novel BOP-compatible dataset, featuring a diverse set of metallic objects (cans, household, and industrial items) under various lighting and background conditions, provides additional geometric and visual cues. We demonstrate that these cues can be effectively leveraged to enhance overall performance. To illustrate the usefulness of the additional features, we improve upon the GDRNPP algorithm by introducing an additional keypoint prediction and material estimator head in order to improve spatial scene understanding. Evaluations on the new dataset show improved accuracy for metallic objects, supporting the hypothesis that additional geometric and visual cues can improve learning.

We propose a simple and application-friendly network (called SimpleNet) for detecting and localizing anomalies. SimpleNet consists of four components: (1) a pre-trained Feature Extractor that generates local features, (2) a shallow Feature Adapter that transfers local features towards target domain, (3) a simple Anomaly Feature Generator that counterfeits anomaly features by adding Gaussian noise to normal features, and (4) a binary Anomaly Discriminator that distinguishes anomaly features from normal features. During inference, the Anomaly Feature Generator would be discarded. Our approach is based on three intuitions. First, transforming pre-trained features to target-oriented features helps avoid domain bias. Second, generating synthetic anomalies in feature space is more effective, as defects may not have much commonality in the image space. Third, a simple discriminator is much efficient and practical. In spite of simplicity, SimpleNet outperforms previous methods quantitatively and qualitatively. On the MVTec AD benchmark, SimpleNet achieves an anomaly detection AUROC of 99.6%, reducing the error by 55.5% compared to the next best performing model. Furthermore, SimpleNet is faster than existing methods, with a high frame rate of 77 FPS on a 3080ti GPU. Additionally, SimpleNet demonstrates significant improvements in performance on the One-Class Novelty Detection task. Code: https://github.com/DonaldRR/SimpleNet.

Routine visual inspections of concrete structures are imperative for upholding the safety and integrity of critical infrastructure. Such visual inspections sometimes happen under low-light conditions, e.g., checking for bridge health. Crack segmentation under such conditions is challenging due to the poor contrast between cracks and their surroundings. However, most deep learning methods are designed for well-illuminated crack images and hence their performance drops dramatically in low-light scenes. In addition, conventional approaches require many annotated low-light crack images which is time-consuming. In this paper, we address these challenges by proposing CrackNex, a framework that utilizes reflectance information based on Retinex Theory to help the model learn a unified illumination-invariant representation. Furthermore, we utilize few-shot segmentation to solve the inefficient training data problem. In CrackNex, both a support prototype and a reflectance prototype are extracted from the support set. Then, a prototype fusion module is designed to integrate the features from both prototypes. CrackNex outperforms the SOTA methods on multiple datasets. Additionally, we present the first benchmark dataset, LCSD, for low-light crack segmentation. LCSD consists of 102 well-illuminated crack images and 41 low-light crack images. The dataset and code are available at https://github.com/zy1296/CrackNex.

Ageing structures require periodic inspections to identify structural defects. Previous work has used geometric distortions to locate cracks in synthetic masonry bridge point clouds but has struggled to detect small cracks. To address this limitation, this study proposes a novel 3D multimodal feature, 3DMulti-FPFHI, that combines a customized Fast Point Feature Histogram (FPFH) with an intensity feature. This feature is integrated into the PatchCore anomaly detection algorithm and evaluated through statistical and parametric analyses. The method is further evaluated using point clouds of a real masonry arch bridge and a full-scale experimental model of a concrete tunnel. Results show that the 3D intensity feature enhances inspection quality by improving crack detection; it also enables the identification of water ingress which introduces intensity anomalies. The 3DMulti-FPFHI outperforms FPFH and a state-of-the-art multimodal anomaly detection method. The potential of the method to address diverse infrastructure anomaly detection scenarios is highlighted by the minimal requirements for data compared to learning-based methods. The code and related point cloud dataset are available at https://github.com/Jingyixiong/3D-Multi-FPFHI.

We address the dual problems of novel view synthesis and environment reconstruction from hand-held RGBD sensors. Our contributions include 1) modeling highly specular objects, 2) modeling inter-reflections and Fresnel effects, and 3) enabling surface light field reconstruction with the same input needed to reconstruct shape alone. In cases where scene surface has a strong mirror-like material component, we generate highly detailed environment images, revealing room composition, objects, people, buildings, and trees visible through windows. Our approach yields state of the art view synthesis techniques, operates on low dynamic range imagery, and is robust to geometric and calibration errors.

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and time-consuming. To address this challenge, we propose a novel diffusion-based pipeline for generating high-fidelity industrial datasets with minimal supervision. Our approach conditions the diffusion model on enriched bounding box representations to produce precise segmentation masks, ensuring realistic and accurately localized defect synthesis. Compared to existing layout-conditioned generative methods, our approach improves defect consistency and spatial accuracy. We introduce two quantitative metrics to evaluate the effectiveness of our method and assess its impact on a downstream segmentation task trained on real and synthetic data. Our results demonstrate that diffusion-based synthesis can bridge the gap between artificial and real-world industrial data, fostering more reliable and cost-efficient segmentation models. The code is publicly available at https://github.com/covisionlab/diffusion_labeling.

Keypoint detection & descriptors are foundational tech-nologies for computer vision tasks like image matching, 3D reconstruction and visual odometry. Hand-engineered methods like Harris corners, SIFT, and HOG descriptors have been used for decades; more recently, there has been a trend to introduce learning in an attempt to improve keypoint detectors. On inspection however, the results are difficult to interpret; recent learning-based methods employ a vast diversity of experimental setups and design choices: empirical results are often reported using different backbones, protocols, datasets, types of supervisions or tasks. Since these differences are often coupled together, it raises a natural question on what makes a good learned keypoint detector. In this work, we revisit the design of existing keypoint detectors by deconstructing their methodologies and identifying the key components. We re-design each component from first-principle and propose Simple Learned Keypoints (SiLK) that is fully-differentiable, lightweight, and flexible. Despite its simplicity, SiLK advances new state-of-the-art on Detection Repeatability and Homography Estimation tasks on HPatches and 3D Point-Cloud Registration task on ScanNet, and achieves competitive performance to state-of-the-art on camera pose estimation in 2022 Image Matching Challenge and ScanNet.

We propose a method, named DualMesh-UDF, to extract a surface from unsigned distance functions (UDFs), encoded by neural networks, or neural UDFs. Neural UDFs are becoming increasingly popular for surface representation because of their versatility in presenting surfaces with arbitrary topologies, as opposed to the signed distance function that is limited to representing a closed surface. However, the applications of neural UDFs are hindered by the notorious difficulty in extracting the target surfaces they represent. Recent methods for surface extraction from a neural UDF suffer from significant geometric errors or topological artifacts due to two main difficulties: (1) A UDF does not exhibit sign changes; and (2) A neural UDF typically has substantial approximation errors. DualMesh-UDF addresses these two difficulties. Specifically, given a neural UDF encoding a target surface S to be recovered, we first estimate the tangent planes of S at a set of sample points close to S. Next, we organize these sample points into local clusters, and for each local cluster, solve a linear least squares problem to determine a final surface point. These surface points are then connected to create the output mesh surface, which approximates the target surface. The robust estimation of the tangent planes of the target surface and the subsequent minimization problem constitute our core strategy, which contributes to the favorable performance of DualMesh-UDF over other competing methods. To efficiently implement this strategy, we employ an adaptive Octree. Within this framework, we estimate the location of a surface point in each of the octree cells identified as containing part of the target surface. Extensive experiments show that our method outperforms existing methods in terms of surface reconstruction quality while maintaining comparable computational efficiency.

Recent generative models show impressive performance in generating photographic images. Humans can hardly distinguish such incredibly realistic-looking AI-generated images from real ones. AI-generated images may lead to ubiquitous disinformation dissemination. Therefore, it is of utmost urgency to develop a detector to identify AI generated images. Most existing detectors suffer from sharp performance drops over unseen generative models. In this paper, we propose a novel AI-generated image detector capable of identifying fake images created by a wide range of generative models. We observe that the texture patches of images tend to reveal more traces left by generative models compared to the global semantic information of the images. A novel Smash&Reconstruction preprocessing is proposed to erase the global semantic information and enhance texture patches. Furthermore, pixels in rich texture regions exhibit more significant fluctuations than those in poor texture regions. Synthesizing realistic rich texture regions proves to be more challenging for existing generative models. Based on this principle, we leverage the inter-pixel correlation contrast between rich and poor texture regions within an image to further boost the detection performance. In addition, we build a comprehensive AI-generated image detection benchmark, which includes 17 kinds of prevalent generative models, to evaluate the effectiveness of existing baselines and our approach. Our benchmark provides a leaderboard for follow-up studies. Extensive experimental results show that our approach outperforms state-of-the-art baselines by a significant margin. Our project: https://fdmas.github.io/AIGCDetect

This paper presents a learning-based method for transparent surface estimation from a single view polarization image. Existing shape from polarization(SfP) methods have the difficulty in estimating transparent shape since the inherent transmission interference heavily reduces the reliability of physics-based prior. To address this challenge, we propose the concept of physics-based prior, which is inspired by the characteristic that the transmission component in the polarization image has more noise than reflection. The confidence is used to determine the contribution of the interfered physics-based prior. Then, we build a network(TransSfP) with multi-branch architecture to avoid the destruction of relationships between different hierarchical inputs. To train and test our method, we construct a dataset for transparent shape from polarization with paired polarization images and ground-truth normal maps. Extensive experiments and comparisons demonstrate the superior accuracy of our method.

We present an automated and efficient approach for retrieving high-quality CAD models of objects and their poses in a scene captured by a moving RGB-D camera. We first investigate various objective functions to measure similarity between a candidate CAD object model and the available data, and the best objective function appears to be a "render-and-compare" method comparing depth and mask rendering. We thus introduce a fast-search method that approximates an exhaustive search based on this objective function for simultaneously retrieving the object category, a CAD model, and the pose of an object given an approximate 3D bounding box. This method involves a search tree that organizes the CAD models and object properties including object category and pose for fast retrieval and an algorithm inspired by Monte Carlo Tree Search, that efficiently searches this tree. We show that this method retrieves CAD models that fit the real objects very well, with a speed-up factor of 10x to 120x compared to exhaustive search.

Gas leakage poses a significant hazard that requires prevention. Traditionally, human inspection has been used for detection, a slow and labour-intensive process. Recent research has applied machine learning techniques to this problem, yet there remains a shortage of high-quality, publicly available datasets. This paper introduces a synthetic dataset, SimGas, featuring diverse backgrounds, interfering foreground objects, diverse leak locations, and precise segmentation ground truth. We propose a zero-shot method that combines background subtraction, zero-shot object detection, filtering, and segmentation to leverage this dataset. Experimental results indicate that our approach significantly outperforms baseline methods based solely on background subtraction and zero-shot object detection with segmentation, reaching an IoU of 69%. We also present an analysis of various prompt configurations and threshold settings to provide deeper insights into the performance of our method. Finally, we qualitatively (because of the lack of ground truth) tested our performance on GasVid and reached decent results on the real-world dataset. The dataset, code, and full qualitative results are available at https://github.com/weathon/Lang-Gas.

We introduce a simple and intuitive self-supervision task, Natural Synthetic Anomalies (NSA), for training an end-to-end model for anomaly detection and localization using only normal training data. NSA integrates Poisson image editing to seamlessly blend scaled patches of various sizes from separate images. This creates a wide range of synthetic anomalies which are more similar to natural sub-image irregularities than previous data-augmentation strategies for self-supervised anomaly detection. We evaluate the proposed method using natural and medical images. Our experiments with the MVTec AD dataset show that a model trained to localize NSA anomalies generalizes well to detecting real-world a priori unknown types of manufacturing defects. Our method achieves an overall detection AUROC of 97.2 outperforming all previous methods that learn without the use of additional datasets. Code available at https://github.com/hmsch/natural-synthetic-anomalies.

Mechanical defects in real situations affect observation values and cause abnormalities in multivariate time series, such as sensor values or network data. To perceive abnormalities in such data, it is crucial to understand the temporal context and interrelation between variables simultaneously. The anomaly detection task for time series, especially for unlabeled data, has been a challenging problem, and we address it by applying a suitable data degradation scheme to self-supervised model training. We define four types of synthetic outliers and propose the degradation scheme in which a portion of input data is replaced with one of the synthetic outliers. Inspired by the self-attention mechanism, we design a Transformer-based architecture to recognize the temporal context and detect unnatural sequences with high efficiency. Our model converts multivariate data points into temporal representations with relative position bias and yields anomaly scores from these representations. Our method, AnomalyBERT, shows a great capability of detecting anomalies contained in complex time series and surpasses previous state-of-the-art methods on five real-world benchmarks. Our code is available at https://github.com/Jhryu30/AnomalyBERT.

We propose a simple three-stage approach to segment unseen objects in RGB images using their CAD models. Leveraging recent powerful foundation models, DINOv2 and Segment Anything, we create descriptors and generate proposals, including binary masks for a given input RGB image. By matching proposals with reference descriptors created from CAD models, we achieve precise object ID assignment along with modal masks. We experimentally demonstrate that our method achieves state-of-the-art results in CAD-based novel object segmentation, surpassing existing approaches on the seven core datasets of the BOP challenge by 19.8\% AP using the same BOP evaluation protocol. Our source code is available at https://github.com/nv-nguyen/cnos.

Estimating the pose of an object from a monocular image is an inverse problem fundamental in computer vision. The ill-posed nature of this problem requires incorporating deformation priors to solve it. In practice, many materials do not perceptibly shrink or extend when manipulated, constituting a powerful and well-known prior. Mathematically, this translates to the preservation of the Riemannian metric. Neural networks offer the perfect playground to solve the surface reconstruction problem as they can approximate surfaces with arbitrary precision and allow the computation of differential geometry quantities. This paper presents an approach to inferring continuous deformable surfaces from a sequence of images, which is benchmarked against several techniques and obtains state-of-the-art performance without the need for offline training.

We focus on a fundamental task of detecting meaningful line structures, a.k.a. semantic line, in natural scenes. Many previous methods regard this problem as a special case of object detection and adjust existing object detectors for semantic line detection. However, these methods neglect the inherent characteristics of lines, leading to sub-optimal performance. Lines enjoy much simpler geometric property than complex objects and thus can be compactly parameterized by a few arguments. To better exploit the property of lines, in this paper, we incorporate the classical Hough transform technique into deeply learned representations and propose a one-shot end-to-end learning framework for line detection. By parameterizing lines with slopes and biases, we perform Hough transform to translate deep representations into the parametric domain, in which we perform line detection. Specifically, we aggregate features along candidate lines on the feature map plane and then assign the aggregated features to corresponding locations in the parametric domain. Consequently, the problem of detecting semantic lines in the spatial domain is transformed into spotting individual points in the parametric domain, making the post-processing steps, i.e. non-maximal suppression, more efficient. Furthermore, our method makes it easy to extract contextual line features eg features along lines close to a specific line, that are critical for accurate line detection. In addition to the proposed method, we design an evaluation metric to assess the quality of line detection and construct a large scale dataset for the line detection task. Experimental results on our proposed dataset and another public dataset demonstrate the advantages of our method over previous state-of-the-art alternatives.

In material sciences, characterizing faults in periodic structures is vital for understanding material properties. To characterize magnetic labyrinthine patterns, it is necessary to accurately identify junctions and terminals, often featuring over a thousand closely packed defects per image. This study introduces a new technique called TM-CNN (Template Matching - Convolutional Neural Network) designed to detect a multitude of small objects in images, such as defects in magnetic labyrinthine patterns. TM-CNN was used to identify these structures in 444 experimental images, and the results were explored to deepen the understanding of magnetic materials. It employs a two-stage detection approach combining template matching, used in initial detection, with a convolutional neural network, used to eliminate incorrect identifications. To train a CNN classifier, it is necessary to create a large number of training images. This difficulty prevents the use of CNN in many practical applications. TM-CNN significantly reduces the manual workload for creating training images by automatically making most of the annotations and leaving only a small number of corrections to human reviewers. In testing, TM-CNN achieved an impressive F1 score of 0.988, far outperforming traditional template matching and CNN-based object detection algorithms.

The detection and classification of exfoliated two-dimensional (2D) material flakes from optical microscope images can be automated using computer vision algorithms. This has the potential to increase the accuracy and objectivity of classification and the efficiency of sample fabrication, and it allows for large-scale data collection. Existing algorithms often exhibit challenges in identifying low-contrast materials and typically require large amounts of training data. Here, we present a deep learning model, called MaskTerial, that uses an instance segmentation network to reliably identify 2D material flakes. The model is extensively pre-trained using a synthetic data generator, that generates realistic microscopy images from unlabeled data. This results in a model that can to quickly adapt to new materials with as little as 5 to 10 images. Furthermore, an uncertainty estimation model is used to finally classify the predictions based on optical contrast. We evaluate our method on eight different datasets comprising five different 2D materials and demonstrate significant improvements over existing techniques in the detection of low-contrast materials such as hexagonal boron nitride.

Standard semantic segmentation models owe their success to curated datasets with a fixed set of semantic categories, without contemplating the possibility of identifying unknown objects from novel categories. Existing methods in outlier detection suffer from a lack of smoothness and objectness in their predictions, due to limitations of the per-pixel classification paradigm. Furthermore, additional training for detecting outliers harms the performance of known classes. In this paper, we explore another paradigm with region-level classification to better segment unknown objects. We show that the object queries in mask classification tend to behave like one \vs all classifiers. Based on this finding, we propose a novel outlier scoring function called RbA by defining the event of being an outlier as being rejected by all known classes. Our extensive experiments show that mask classification improves the performance of the existing outlier detection methods, and the best results are achieved with the proposed RbA. We also propose an objective to optimize RbA using minimal outlier supervision. Further fine-tuning with outliers improves the unknown performance, and unlike previous methods, it does not degrade the inlier performance.

Effective image restoration with large-size corruptions, such as blind image inpainting, entails precise detection of corruption region masks which remains extremely challenging due to diverse shapes and patterns of corruptions. In this work, we present a novel method for automatic corruption detection, which allows for blind corruption restoration without known corruption masks. Specifically, we develop a hierarchical contrastive learning framework to detect corrupted regions by capturing the intrinsic semantic distinctions between corrupted and uncorrupted regions. In particular, our model detects the corrupted mask in a coarse-to-fine manner by first predicting a coarse mask by contrastive learning in low-resolution feature space and then refines the uncertain area of the mask by high-resolution contrastive learning. A specialized hierarchical interaction mechanism is designed to facilitate the knowledge propagation of contrastive learning in different scales, boosting the modeling performance substantially. The detected multi-scale corruption masks are then leveraged to guide the corruption restoration. Detecting corrupted regions by learning the contrastive distinctions rather than the semantic patterns of corruptions, our model has well generalization ability across different corruption patterns. Extensive experiments demonstrate following merits of our model: 1) the superior performance over other methods on both corruption detection and various image restoration tasks including blind inpainting and watermark removal, and 2) strong generalization across different corruption patterns such as graffiti, random noise or other image content. Codes and trained weights are available at https://github.com/xyfJASON/HCL .

Point-cloud data collected in real-world applications are often incomplete. Data is typically missing due to objects being observed from partial viewpoints, which only capture a specific perspective or angle. Additionally, data can be incomplete due to occlusion and low-resolution sampling. Existing completion approaches rely on datasets of predefined objects to guide the completion of noisy and incomplete, point clouds. However, these approaches perform poorly when tested on Out-Of-Distribution (OOD) objects, that are poorly represented in the training dataset. Here we leverage recent advances in text-guided image generation, which lead to major breakthroughs in text-guided shape generation. We describe an approach called SDS-Complete that uses a pre-trained text-to-image diffusion model and leverages the text semantics of a given incomplete point cloud of an object, to obtain a complete surface representation. SDS-Complete can complete a variety of objects using test-time optimization without expensive collection of 3D information. We evaluate SDS Complete on incomplete scanned objects, captured by real-world depth sensors and LiDAR scanners. We find that it effectively reconstructs objects that are absent from common datasets, reducing Chamfer loss by 50% on average compared with current methods. Project page: https://sds-complete.github.io/

This paper studies zero-shot anomaly classification (AC) and segmentation (AS) in industrial vision. We reveal that the abundant normal and abnormal cues implicit in unlabeled test images can be exploited for anomaly determination, which is ignored by prior methods. Our key observation is that for the industrial product images, the normal image patches could find a relatively large number of similar patches in other unlabeled images, while the abnormal ones only have a few similar patches. We leverage such a discriminative characteristic to design a novel zero-shot AC/AS method by Mutual Scoring (MuSc) of the unlabeled images, which does not need any training or prompts. Specifically, we perform Local Neighborhood Aggregation with Multiple Degrees (LNAMD) to obtain the patch features that are capable of representing anomalies in varying sizes. Then we propose the Mutual Scoring Mechanism (MSM) to leverage the unlabeled test images to assign the anomaly score to each other. Furthermore, we present an optimization approach named Re-scoring with Constrained Image-level Neighborhood (RsCIN) for image-level anomaly classification to suppress the false positives caused by noises in normal images. The superior performance on the challenging MVTec AD and VisA datasets demonstrates the effectiveness of our approach. Compared with the state-of-the-art zero-shot approaches, MuSc achieves a 21.1% PRO absolute gain (from 72.7% to 93.8%) on MVTec AD, a 19.4% pixel-AP gain and a 14.7% pixel-AUROC gain on VisA. In addition, our zero-shot approach outperforms most of the few-shot approaches and is comparable to some one-class methods. Code is available at https://github.com/xrli-U/MuSc.

Automatic security inspection using computer vision technology is a challenging task in real-world scenarios due to various factors, including intra-class variance, class imbalance, and occlusion. Most of the previous methods rarely solve the cases that the prohibited items are deliberately hidden in messy objects due to the lack of large-scale datasets, restricted their applications in real-world scenarios. Towards real-world prohibited item detection, we collect a large-scale dataset, named as PIDray, which covers various cases in real-world scenarios for prohibited item detection, especially for deliberately hidden items. With an intensive amount of effort, our dataset contains 12 categories of prohibited items in 47,677 X-ray images with high-quality annotated segmentation masks and bounding boxes. To the best of our knowledge, it is the largest prohibited items detection dataset to date. Meanwhile, we design the selective dense attention network (SDANet) to construct a strong baseline, which consists of the dense attention module and the dependency refinement module. The dense attention module formed by the spatial and channel-wise dense attentions, is designed to learn the discriminative features to boost the performance. The dependency refinement module is used to exploit the dependencies of multi-scale features. Extensive experiments conducted on the collected PIDray dataset demonstrate that the proposed method performs favorably against the state-of-the-art methods, especially for detecting the deliberately hidden items.

The Gaussian splatting for radiance field rendering method has recently emerged as an efficient approach for accurate scene representation. It optimizes the location, size, color, and shape of a cloud of 3D Gaussian elements to visually match, after projection, or splatting, a set of given images taken from various viewing directions. And yet, despite the proximity of Gaussian elements to the shape boundaries, direct surface reconstruction of objects in the scene is a challenge. We propose a novel approach for surface reconstruction from Gaussian splatting models. Rather than relying on the Gaussian elements' locations as a prior for surface reconstruction, we leverage the superior novel-view synthesis capabilities of 3DGS. To that end, we use the Gaussian splatting model to render pairs of stereo-calibrated novel views from which we extract depth profiles using a stereo matching method. We then combine the extracted RGB-D images into a geometrically consistent surface. The resulting reconstruction is more accurate and shows finer details when compared to other methods for surface reconstruction from Gaussian splatting models, while requiring significantly less compute time compared to other surface reconstruction methods. We performed extensive testing of the proposed method on in-the-wild scenes, taken by a smartphone, showcasing its superior reconstruction abilities. Additionally, we tested the proposed method on the Tanks and Temples benchmark, and it has surpassed the current leading method for surface reconstruction from Gaussian splatting models. Project page: https://gs2mesh.github.io/.

Anomaly detection and localization of visual data, including images and videos, are of great significance in both machine learning academia and applied real-world scenarios. Despite the rapid development of visual anomaly detection techniques in recent years, the interpretations of these black-box models and reasonable explanations of why anomalies can be distinguished out are scarce. This paper provides the first survey concentrated on explainable visual anomaly detection methods. We first introduce the basic background of image-level and video-level anomaly detection. Then, as the main content of this survey, a comprehensive and exhaustive literature review of explainable anomaly detection methods for both images and videos is presented. Next, we analyze why some explainable anomaly detection methods can be applied to both images and videos and why others can be only applied to one modality. Additionally, we provide summaries of current 2D visual anomaly detection datasets and evaluation metrics. Finally, we discuss several promising future directions and open problems to explore the explainability of 2D visual anomaly detection. The related resource collection is given at https://github.com/wyzjack/Awesome-XAD.

Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy

Resonant anomaly detection methods have great potential for enhancing the sensitivity of traditional bump hunt searches. A key component of these methods is a high quality background template used to produce an anomaly score. Using the LHC Olympics R&D dataset, we demonstrate that this background template can also be repurposed to directly estimate the background expectation in a simple cut and count setup. In contrast to a traditional bump hunt, no fit to the invariant mass distribution is needed, thereby avoiding the potential problem of background sculpting. Furthermore, direct background estimation allows working with large background rejection rates, where resonant anomaly detection methods typically show their greatest improvement in significance.

Removing clutter from scenes is essential in many applications, ranging from privacy-concerned content filtering to data augmentation. In this work, we present an automatic system that removes clutter from 3D scenes and inpaints with coherent geometry and texture. We propose techniques for its two key components: 3D segmentation from shared properties and 3D inpainting, both of which are important porblems. The definition of 3D scene clutter (frequently-moving objects) is not well captured by commonly-studied object categories in computer vision. To tackle the lack of well-defined clutter annotations, we group noisy fine-grained labels, leverage virtual rendering, and impose an instance-level area-sensitive loss. Once clutter is removed, we inpaint geometry and texture in the resulting holes by merging inpainted RGB-D images. This requires novel voting and pruning strategies that guarantee multi-view consistency across individually inpainted images for mesh reconstruction. Experiments on ScanNet and Matterport dataset show that our method outperforms baselines for clutter segmentation and 3D inpainting, both visually and quantitatively.

In this paper, we propose a learning-based image fragment pair-searching and -matching approach to solve the challenging restoration problem. Existing works use rule-based methods to match similar contour shapes or textures, which are always difficult to tune hyperparameters for extensive data and computationally time-consuming. Therefore, we propose a neural network that can effectively utilize neighbor textures with contour shape information to fundamentally improve performance. First, we employ a graph-based network to extract the local contour and texture features of fragments. Then, for the pair-searching task, we adopt a linear transformer-based module to integrate these local features and use contrastive loss to encode the global features of each fragment. For the pair-matching task, we design a weighted fusion module to dynamically fuse extracted local contour and texture features, and formulate a similarity matrix for each pair of fragments to calculate the matching score and infer the adjacent segment of contours. To faithfully evaluate our proposed network, we created a new image fragment dataset through an algorithm we designed that tears complete images into irregular fragments. The experimental results show that our proposed network achieves excellent pair-searching accuracy, reduces matching errors, and significantly reduces computational time. Details, sourcecode, and data are available in our supplementary material.

The practical deployment of Visual Anomaly Detection (VAD) systems is hindered by their sensitivity to real-world imaging variations, particularly the complex interplay between viewpoint and illumination which drastically alters defect visibility. Current benchmarks largely overlook this critical challenge. We introduce Multi-View Multi-Illumination Anomaly Detection (M2AD), a new large-scale benchmark comprising 119,880 high-resolution images designed explicitly to probe VAD robustness under such interacting conditions. By systematically capturing 999 specimens across 10 categories using 12 synchronized views and 10 illumination settings (120 configurations total), M2AD enables rigorous evaluation. We establish two evaluation protocols: M2AD-Synergy tests the ability to fuse information across diverse configurations, and M2AD-Invariant measures single-image robustness against realistic view-illumination effects. Our extensive benchmarking shows that state-of-the-art VAD methods struggle significantly on M2AD, demonstrating the profound challenge posed by view-illumination interplay. This benchmark serves as an essential tool for developing and validating VAD methods capable of overcoming real-world complexities. Our full dataset and test suite will be released at https://hustcyq.github.io/M2AD to facilitate the field.

In this paper, we are interested in addressing the problem of damage assessment for vehicles, such as cars. This task requires not only detecting the location and the extent of the damage but also identifying the damaged part. To train a computer vision system for the semantic part and damage segmentation in images, we need to manually annotate images with costly pixel annotations for both part categories and damage types. To overcome this need, we propose to use synthetic data to train these models. Synthetic data can provide samples with high variability, pixel-accurate annotations, and arbitrarily large training sets without any human intervention. We propose a procedural generation pipeline that damages 3D car models and we obtain synthetic 2D images of damaged cars paired with pixel-accurate annotations for part and damage categories. To validate our idea, we execute our pipeline and render our CrashCar101 dataset. We run experiments on three real datasets for the tasks of part and damage segmentation. For part segmentation, we show that the segmentation models trained on a combination of real data and our synthetic data outperform all models trained only on real data. For damage segmentation, we show the sim2real transfer ability of CrashCar101.

The impact of soiling on solar panels is an important and well-studied problem in renewable energy sector. In this paper, we present the first convolutional neural network (CNN) based approach for solar panel soiling and defect analysis. Our approach takes an RGB image of solar panel and environmental factors as inputs to predict power loss, soiling localization, and soiling type. In computer vision, localization is a complex task which typically requires manually labeled training data such as bounding boxes or segmentation masks. Our proposed approach consists of specialized four stages which completely avoids localization ground truth and only needs panel images with power loss labels for training. The region of impact area obtained from the predicted localization masks are classified into soiling types using the webly supervised learning. For improving localization capabilities of CNNs, we introduce a novel bi-directional input-aware fusion (BiDIAF) block that reinforces the input at different levels of CNN to learn input-specific feature maps. Our empirical study shows that BiDIAF improves the power loss prediction accuracy by about 3% and localization accuracy by about 4%. Our end-to-end model yields further improvement of about 24% on localization when learned in a weakly supervised manner. Our approach is generalizable and showed promising results on web crawled solar panel images. Our system has a frame rate of 22 fps (including all steps) on a NVIDIA TitanX GPU. Additionally, we collected first of it's kind dataset for solar panel image analysis consisting 45,000+ images.

This work studies the problem of panoptic symbol spotting, which is to spot and parse both countable object instances (windows, doors, tables, etc.) and uncountable stuff (wall, railing, etc.) from computer-aided design (CAD) drawings. Existing methods typically involve either rasterizing the vector graphics into images and using image-based methods for symbol spotting, or directly building graphs and using graph neural networks for symbol recognition. In this paper, we take a different approach, which treats graphic primitives as a set of 2D points that are locally connected and use point cloud segmentation methods to tackle it. Specifically, we utilize a point transformer to extract the primitive features and append a mask2former-like spotting head to predict the final output. To better use the local connection information of primitives and enhance their discriminability, we further propose the attention with connection module (ACM) and contrastive connection learning scheme (CCL). Finally, we propose a KNN interpolation mechanism for the mask attention module of the spotting head to better handle primitive mask downsampling, which is primitive-level in contrast to pixel-level for the image. Our approach, named SymPoint, is simple yet effective, outperforming recent state-of-the-art method GAT-CADNet by an absolute increase of 9.6% PQ and 10.4% RQ on the FloorPlanCAD dataset. The source code and models will be available at https://github.com/nicehuster/SymPoint.

We propose a novel point-based representation, Gaussian surfels, to combine the advantages of the flexible optimization procedure in 3D Gaussian points and the surface alignment property of surfels. This is achieved by directly setting the z-scale of 3D Gaussian points to 0, effectively flattening the original 3D ellipsoid into a 2D ellipse. Such a design provides clear guidance to the optimizer. By treating the local z-axis as the normal direction, it greatly improves optimization stability and surface alignment. While the derivatives to the local z-axis computed from the covariance matrix are zero in this setting, we design a self-supervised normal-depth consistency loss to remedy this issue. Monocular normal priors and foreground masks are incorporated to enhance the quality of the reconstruction, mitigating issues related to highlights and background. We propose a volumetric cutting method to aggregate the information of Gaussian surfels so as to remove erroneous points in depth maps generated by alpha blending. Finally, we apply screened Poisson reconstruction method to the fused depth maps to extract the surface mesh. Experimental results show that our method demonstrates superior performance in surface reconstruction compared to state-of-the-art neural volume rendering and point-based rendering methods.

This paper considers zero-shot Anomaly Detection (AD), performing AD without reference images of the test objects. We propose a framework called CLIP-AD to leverage the zero-shot capabilities of the large vision-language model CLIP. Firstly, we reinterpret the text prompts design from a distributional perspective and propose a Representative Vector Selection (RVS) paradigm to obtain improved text features. Secondly, we note opposite predictions and irrelevant highlights in the direct computation of the anomaly maps. To address these issues, we introduce a Staged Dual-Path model (SDP) that leverages features from various levels and applies architecture and feature surgery. Lastly, delving deeply into the two phenomena, we point out that the image and text features are not aligned in the joint embedding space. Thus, we introduce a fine-tuning strategy by adding linear layers and construct an extended model SDP+, further enhancing the performance. Abundant experiments demonstrate the effectiveness of our approach, e.g., on MVTec-AD, SDP outperforms the SOTA WinCLIP by +4.2/+10.7 in segmentation metrics F1-max/PRO, while SDP+ achieves +8.3/+20.5 improvements.

3D Anomaly Detection (AD) has shown great potential in detecting anomalies or defects of high-precision industrial products. However, existing methods are typically trained in a class-specific manner and also lack the capability of learning from emerging classes. In this study, we proposed a continual learning framework named Continual 3D Anomaly Detection (C3D-AD), which can not only learn generalized representations for multi-class point clouds but also handle new classes emerging over time.Specifically, in the feature extraction module, to extract generalized local features from diverse product types of different tasks efficiently, Kernel Attention with random feature Layer (KAL) is introduced, which normalizes the feature space. Then, to reconstruct data correctly and continually, an efficient Kernel Attention with learnable Advisor (KAA) mechanism is proposed, which learns the information from new categories while discarding redundant old information within both the encoder and decoder. Finally, to keep the representation consistency over tasks, a Reconstruction with Parameter Perturbation (RPP) module is proposed by designing a representation rehearsal loss function, which ensures that the model remembers previous category information and returns category-adaptive representation.Extensive experiments on three public datasets demonstrate the effectiveness of the proposed method, achieving an average performance of 66.4%, 83.1%, and 63.4% AUROC on Real3D-AD, Anomaly-ShapeNet, and MulSen-AD, respectively.

3D visual grounding aims to locate the referred target object in 3D point cloud scenes according to a free-form language description. Previous methods mostly follow a two-stage paradigm, i.e., language-irrelevant detection and cross-modal matching, which is limited by the isolated architecture. In such a paradigm, the detector needs to sample keypoints from raw point clouds due to the inherent properties of 3D point clouds (irregular and large-scale), to generate the corresponding object proposal for each keypoint. However, sparse proposals may leave out the target in detection, while dense proposals may confuse the matching model. Moreover, the language-irrelevant detection stage can only sample a small proportion of keypoints on the target, deteriorating the target prediction. In this paper, we propose a 3D Single-Stage Referred Point Progressive Selection (3D-SPS) method, which progressively selects keypoints with the guidance of language and directly locates the target. Specifically, we propose a Description-aware Keypoint Sampling (DKS) module to coarsely focus on the points of language-relevant objects, which are significant clues for grounding. Besides, we devise a Target-oriented Progressive Mining (TPM) module to finely concentrate on the points of the target, which is enabled by progressive intra-modal relation modeling and inter-modal target mining. 3D-SPS bridges the gap between detection and matching in the 3D visual grounding task, localizing the target at a single stage. Experiments demonstrate that 3D-SPS achieves state-of-the-art performance on both ScanRefer and Nr3D/Sr3D datasets.

Transparent object manipulation remains a significant challenge in robotics due to the difficulty of acquiring accurate and dense depth measurements. Conventional depth sensors often fail with transparent objects, resulting in incomplete or erroneous depth data. Existing depth completion methods struggle with interframe consistency and incorrectly model transparent objects as Lambertian surfaces, leading to poor depth reconstruction. To address these challenges, we propose TranSplat, a surface embedding-guided 3D Gaussian Splatting method tailored for transparent objects. TranSplat uses a latent diffusion model to generate surface embeddings that provide consistent and continuous representations, making it robust to changes in viewpoint and lighting. By integrating these surface embeddings with input RGB images, TranSplat effectively captures the complexities of transparent surfaces, enhancing the splatting of 3D Gaussians and improving depth completion. Evaluations on synthetic and real-world transparent object benchmarks, as well as robot grasping tasks, show that TranSplat achieves accurate and dense depth completion, demonstrating its effectiveness in practical applications. We open-source synthetic dataset and model: https://github. com/jeongyun0609/TranSplat

Point clouds are widely used for infrastructure monitoring by providing geometric information, where segmentation is required for downstream tasks such as defect detection. Existing research has automated semantic segmentation of structural components, while brick-level segmentation (identifying defects such as spalling and mortar loss) has been primarily conducted from RGB images. However, acquiring high-resolution images is impractical in low-light environments like masonry tunnels. Point clouds, though robust to dim lighting, are typically unstructured, sparse, and noisy, limiting fine-grained segmentation. We present InfraDiffusion, a zero-shot framework that projects masonry point clouds into depth maps using virtual cameras and restores them by adapting the Denoising Diffusion Null-space Model (DDNM). Without task-specific training, InfraDiffusion enhances visual clarity and geometric consistency of depth maps. Experiments on masonry bridge and tunnel point cloud datasets show significant improvements in brick-level segmentation using the Segment Anything Model (SAM), underscoring its potential for automated inspection of masonry assets. Our code and data is available at https://github.com/Jingyixiong/InfraDiffusion-official-implement.

The widespread use of various chemical gases in industrial processes necessitates effective measures to prevent their leakage during transportation and storage, given their high toxicity. Thermal infrared-based computer vision detection techniques provide a straightforward approach to identify gas leakage areas. However, the development of high-quality algorithms has been challenging due to the low texture in thermal images and the lack of open-source datasets. In this paper, we present the RGB-Thermal Cross Attention Network (RT-CAN), which employs an RGB-assisted two-stream network architecture to integrate texture information from RGB images and gas area information from thermal images. Additionally, to facilitate the research of invisible gas detection, we introduce Gas-DB, an extensive open-source gas detection database including about 1.3K well-annotated RGB-thermal images with eight variant collection scenes. Experimental results demonstrate that our method successfully leverages the advantages of both modalities, achieving state-of-the-art (SOTA) performance among RGB-thermal methods, surpassing single-stream SOTA models in terms of accuracy, Intersection of Union (IoU), and F2 metrics by 4.86%, 5.65%, and 4.88%, respectively. The code and data can be found at https://github.com/logic112358/RT-CAN.

Due to scarcity of anomaly situations in the early manufacturing stage, an unsupervised anomaly detection (UAD) approach is widely adopted which only uses normal samples for training. This approach is based on the assumption that the trained UAD model will accurately reconstruct normal patterns but struggles with unseen anomalous patterns. To enhance the UAD performance, reconstruction-by-inpainting based methods have recently been investigated, especially on the masking strategy of suspected defective regions. However, there are still issues to overcome: 1) time-consuming inference due to multiple masking, 2) output inconsistency by random masking strategy, and 3) inaccurate reconstruction of normal patterns when the masked area is large. Motivated by this, we propose a novel reconstruction-by-inpainting method, dubbed Excision And Recovery (EAR), that features single deterministic masking based on the ImageNet pre-trained DINO-ViT and visual obfuscation for hint-providing. Experimental results on the MVTec AD dataset show that deterministic masking by pre-trained attention effectively cuts out suspected defective regions and resolve the aforementioned issues 1 and 2. Also, hint-providing by mosaicing proves to enhance the UAD performance than emptying those regions by binary masking, thereby overcomes issue 3. Our approach achieves a high UAD performance without any change of the neural network structure. Thus, we suggest that EAR be adopted in various manufacturing industries as a practically deployable solution.

Generalizable neural surface reconstruction techniques have attracted great attention in recent years. However, they encounter limitations of low confidence depth distribution and inaccurate surface reasoning due to the oversimplified volume rendering process employed. In this paper, we present Reconstruction TRansformer (ReTR), a novel framework that leverages the transformer architecture to redesign the rendering process, enabling complex render interaction modeling. It introduces a learnable meta-ray token and utilizes the cross-attention mechanism to simulate the interaction of rendering process with sampled points and render the observed color. Meanwhile, by operating within a high-dimensional feature space rather than the color space, ReTR mitigates sensitivity to projected colors in source views. Such improvements result in accurate surface assessment with high confidence. We demonstrate the effectiveness of our approach on various datasets, showcasing how our method outperforms the current state-of-the-art approaches in terms of reconstruction quality and generalization ability. Our code is available at https://github.com/YixunLiang/ReTR.

Accurately detecting and classifying damage in analogue media such as paintings, photographs, textiles, mosaics, and frescoes is essential for cultural heritage preservation. While machine learning models excel in correcting degradation if the damage operator is known a priori, we show that they fail to robustly predict where the damage is even after supervised training; thus, reliable damage detection remains a challenge. Motivated by this, we introduce ARTeFACT, a dataset for damage detection in diverse types analogue media, with over 11,000 annotations covering 15 kinds of damage across various subjects, media, and historical provenance. Furthermore, we contribute human-verified text prompts describing the semantic contents of the images, and derive additional textual descriptions of the annotated damage. We evaluate CNN, Transformer, diffusion-based segmentation models, and foundation vision models in zero-shot, supervised, unsupervised and text-guided settings, revealing their limitations in generalising across media types. Our dataset is available at https://daniela997.github.io/ARTeFACT/{https://daniela997.github.io/ARTeFACT/} as the first-of-its-kind benchmark for analogue media damage detection and restoration.

Relying on large-scale training data with pixel-level labels, previous edge detection methods have achieved high performance. However, it is hard to manually label edges accurately, especially for large datasets, and thus the datasets inevitably contain noisy labels. This label-noise issue has been studied extensively for classification, while still remaining under-explored for edge detection. To address the label-noise issue for edge detection, this paper proposes to learn Pixel-level NoiseTransitions to model the label-corruption process. To achieve it, we develop a novel Pixel-wise Shift Learning (PSL) module to estimate the transition from clean to noisy labels as a displacement field. Exploiting the estimated noise transitions, our model, named PNT-Edge, is able to fit the prediction to clean labels. In addition, a local edge density regularization term is devised to exploit local structure information for better transition learning. This term encourages learning large shifts for the edges with complex local structures. Experiments on SBD and Cityscapes demonstrate the effectiveness of our method in relieving the impact of label noise. Codes will be available at github.

Robust 3D perception under corruption has become an essential task for the realm of 3D vision. While current data augmentation techniques usually perform random transformations on all point cloud objects in an offline way and ignore the structure of the samples, resulting in over-or-under enhancement. In this work, we propose an alternative to make sample-adaptive transformations based on the structure of the sample to cope with potential corruption via an auto-augmentation framework, named as AdaptPoint. Specially, we leverage a imitator, consisting of a Deformation Controller and a Mask Controller, respectively in charge of predicting deformation parameters and producing a per-point mask, based on the intrinsic structural information of the input point cloud, and then conduct corruption simulations on top. Then a discriminator is utilized to prevent the generation of excessive corruption that deviates from the original data distribution. In addition, a perception-guidance feedback mechanism is incorporated to guide the generation of samples with appropriate difficulty level. Furthermore, to address the paucity of real-world corrupted point cloud, we also introduce a new dataset ScanObjectNN-C, that exhibits greater similarity to actual data in real-world environments, especially when contrasted with preceding CAD datasets. Experiments show that our method achieves state-of-the-art results on multiple corruption benchmarks, including ModelNet-C, our ScanObjectNN-C, and ShapeNet-C.

Recently, large-scale vision-language models such as CLIP have demonstrated immense potential in zero-shot anomaly segmentation (ZSAS) task, utilizing a unified model to directly detect anomalies on any unseen product with painstakingly crafted text prompts. However, existing methods often assume that the product category to be inspected is known, thus setting product-specific text prompts, which is difficult to achieve in the data privacy scenarios. Moreover, even the same type of product exhibits significant differences due to specific components and variations in the production process, posing significant challenges to the design of text prompts. In this end, we propose a visual context prompting model (VCP-CLIP) for ZSAS task based on CLIP. The insight behind VCP-CLIP is to employ visual context prompting to activate CLIP's anomalous semantic perception ability. In specific, we first design a Pre-VCP module to embed global visual information into the text prompt, thus eliminating the necessity for product-specific prompts. Then, we propose a novel Post-VCP module, that adjusts the text embeddings utilizing the fine-grained features of the images. In extensive experiments conducted on 10 real-world industrial anomaly segmentation datasets, VCP-CLIP achieved state-of-the-art performance in ZSAS task. The code is available at https://github.com/xiaozhen228/VCP-CLIP.

Visuo-tactile perception aims to understand an object's tactile properties, such as texture, softness, and rigidity. However, the field remains underexplored because collecting tactile data is costly and labor-intensive. We observe that visually distinct objects can exhibit similar surface textures or material properties. For example, a leather sofa and a leather jacket have different appearances but share similar tactile properties. This implies that tactile understanding can be guided by material cues in visual data, even without direct tactile supervision. In this paper, we introduce RA-Touch, a retrieval-augmented framework that improves visuo-tactile perception by leveraging visual data enriched with tactile semantics. We carefully recaption a large-scale visual dataset with tactile-focused descriptions, enabling the model to access tactile semantics typically absent from conventional visual datasets. A key challenge remains in effectively utilizing these tactile-aware external descriptions. RA-Touch addresses this by retrieving visual-textual representations aligned with tactile inputs and integrating them to focus on relevant textural and material properties. By outperforming prior methods on the TVL benchmark, our method demonstrates the potential of retrieval-based visual reuse for tactile understanding. Code is available at https://aim-skku.github.io/RA-Touch

In this paper, we propose U-RED, an Unsupervised shape REtrieval and Deformation pipeline that takes an arbitrary object observation as input, typically captured by RGB images or scans, and jointly retrieves and deforms the geometrically similar CAD models from a pre-established database to tightly match the target. Considering existing methods typically fail to handle noisy partial observations, U-RED is designed to address this issue from two aspects. First, since one partial shape may correspond to multiple potential full shapes, the retrieval method must allow such an ambiguous one-to-many relationship. Thereby U-RED learns to project all possible full shapes of a partial target onto the surface of a unit sphere. Then during inference, each sampling on the sphere will yield a feasible retrieval. Second, since real-world partial observations usually contain noticeable noise, a reliable learned metric that measures the similarity between shapes is necessary for stable retrieval. In U-RED, we design a novel point-wise residual-guided metric that allows noise-robust comparison. Extensive experiments on the synthetic datasets PartNet, ComplementMe and the real-world dataset Scan2CAD demonstrate that U-RED surpasses existing state-of-the-art approaches by 47.3%, 16.7% and 31.6% respectively under Chamfer Distance.

Recently, large pre-trained vision-language models have shown remarkable performance in zero-shot anomaly detection (ZSAD). With fine-tuning on a single auxiliary dataset, the model enables cross-category anomaly detection on diverse datasets covering industrial defects and medical lesions. Compared to manually designed prompts, prompt learning eliminates the need for expert knowledge and trial-and-error. However, it still faces the following challenges: (i) static learnable tokens struggle to capture the continuous and diverse patterns of normal and anomalous states, limiting generalization to unseen categories; (ii) fixed textual labels provide overly sparse category information, making the model prone to overfitting to a specific semantic subspace. To address these issues, we propose Conditional Prompt Synthesis (CoPS), a novel framework that synthesizes dynamic prompts conditioned on visual features to enhance ZSAD performance. Specifically, we extract representative normal and anomaly prototypes from fine-grained patch features and explicitly inject them into prompts, enabling adaptive state modeling. Given the sparsity of class labels, we leverage a variational autoencoder to model semantic image features and implicitly fuse varied class tokens into prompts. Additionally, integrated with our spatially-aware alignment mechanism, extensive experiments demonstrate that CoPS surpasses state-of-the-art methods by 2.5% AUROC in both classification and segmentation across 13 industrial and medical datasets. Code will be available at https://github.com/cqylunlun/CoPS.